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The
XLE-3 series reflected light inspection microscope is the
newest medium inspection microscope in China. The adoption
of reflected coaxial illumination ensures the bright-field
observation. It can be connected with 135 camera, digital
camera and image quantitative analysis. This instrument is
suitable for the inspection requirements of a variety of electronic
components including magnetic heads, LCD, and semiconductors.
Its compact size, ease of operation, 10" x 10" stage travel
and cost-effectiveness makes the XLE-3 an ideal inspection
microscope offering superb operational versatility. The instrument
is equipped with plan objective and wide-field eyepiece and
obtains clear and smooth image. The unique character is the
super large stage which can make quick-handed and knob-fine
movement. The samples on the stage can be moved vertically
and horizontally.
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