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The WLXJ21 series
reflected light inspection microscope is the newest medium
inspection microscope in China. The adoption of reflected
coaxial illumination ensures the bright-field observation.
It can be connected with 135 camera, digital camera and
image quantitative analysis. This instrument is suitable for
the inspection requirements of a variety of electronic
components including magnetic heads, LCD, and
semiconductors. Its compact size, ease of operation, 8" x 8"
stage travel and cost-effectiveness makes the AL-2 an ideal
inspection microscope offering superb operational
versatility.
The instrument is equipped with plan objective and
wide-field eyepiece and obtains clear and smooth image. The
unique character is the super large stage which can make
quick-handed and knob-fine movement. The samples on the
stage can be moved vertically and horizontally.
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